X-Ray Microscopy with Record Resolution Using New Multilayer Laue Lenses

Scientists at DESY have developed novel lenses that enable X-ray microscopy with record resolution in the nanometre regime. Using new materials, the research team led by DESY scientist Saša Bajt from the Center for Free-Electron Laser Science (CFEL) has perfected the design of specialised X-ray optics and achieved a focus spot size with a diameter of less than ten nanometres. A nanometre is a millionths of a millimetre and is smaller than most virus particles. The researchers report their work in the journal Light: Science and Applications.

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